New Generation of AC/DC Programmable Power Source for Server Power Supply Testing

The server market is steadily growing due to strong demands from cloud service providers and the expansion of next generation IT related infrastructures.

Mission critical server power supplies require testing and verification against stringent regulatory test standards to ensure operational efficiency of the server system. For instance, the immunity test standard includes voltage dips, short interruptions, and variations for both AC and DC as input requirements. Another functionality test includes simulating the transfer of input power from the main to backup system via UPS or HVDC system during abnormal power conditions (figure 1) to ensure dropout timing requirements are met.

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▲Figure1: Transfer of power during power loss condition

Chroma model 61509 (figure 2) is a high power density (5U height), 6kVA single- and three-phase output programmable AC Source capable of meeting rigorous test standards. With a maximum output voltage of 350Vac/495Vdc, the 61509 meets both AC and DC input voltage test requirements for server power supplies.

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▲Figure2: Chroma model 61509

Furthermore, the DC output power rating of the 61509 has been increased to 75% of the full rated output power and the control loop for individual coupling mode (AC, DC, AC+DC) has also been optimized to further extend test capabilities for AC/DC server power supplies. The 61509 is capable of delivering output frequency up to 2000Hz and possesses the ability to generate pure sine waveform output with typical distortion of less than 0.3% at 50/60Hz. These features make the 61509 ideal for commercial, power electronics, avionics, military, and regulation test applications from bench-top R/D design verification and quality assurance to mass production.

For more information on the Chroma 61509 features and specifications, please visit Chroma’s website: Programmable AC Power Source Model 61509/61508/61507 

Chroma CEO, Leo Huang, ranked No. 14 in Taiwan’s “2018 Top 50 Best-Performing CEOs”

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Chroma CEO, Leo Huang, ranked 14th in the 2018 Taiwan’s Top 50 Best-Performing CEOs by《Harvard Business Review》Traditional Chinese version. The ranking advanced 24 places comparing to the 38th in 2016. The ranking criteria of HBR were based on the total shareholder return and the change of company’s market capitalization within the CEO’s tenure. Since 2016, Chroma has grown more than doubled in both ROE, from 1,011% to 2,492%, and market value increment, from NT$34.5 billion to NT$71.4 billion.

Enhancing Product Value by Seizing the Market Trends

Chairman, Leo Huang, co-founded Chroma ATE Inc. in 1984 to provide high precision electronic test equipment and system, under the brand name “Chroma”. Significant markets Chroma serves include displays, power electronics, passive components, electrical safety, semiconductor/IC, LED, solar energy, green battery, electric vehicle and photonics industries. Chroma has been persistently and actively developing precise, reliable, and unique products with dedication to becoming a world-class enterprise of innovative technology and globalization.

Foresaw the booming market in electric vehicle, power battery, 3D sensor, 8K display, IoT semiconductor and green energy, Chroma has brought innovative test solutions to the market that drive the sales for the last two years. In capturing the Industry 4.0 smart manufacturing, Chroma is one of the few companies that encompasses measurement and smart-automation. With added AI industrial solution, Chroma can assist customers in improving the manufacturing process with big data analytics and machine learning providing a more complete turnkey solution. It not only satisfies the global 1st tier customers testing needs ensuring the performance and quality of their products, but also enriches the “Chroma” brand value.

Chroma Offers Semiconductor Test Solutions beyond Your Expectation

From nanoparticle monitoring for processing liquids to semiconductor testing complying with AIoT applications

To be in the tech trend of IoT, Chroma ATE provides a wide portfolio of semiconductor IC test solutions ranging from ATE, PXI systems, IC handlers, and system level test solutions. Innovative Nanotech, a member of Chroma Group, has introduced nanoparticles monitoring systems for semiconductor front-end processes. In SEMICON Taiwan 2018, Chroma will exhibit the SuperSizer in-line nanoparticle monitoring system for you to experience it on site.

SuperSizer Nanoparticle Monitoring System
The technology nodes of semiconductor have advanced to 10 nm and 7 nm at an extremely fast speed, and will be 5 nm or even 3 nm in the near future. However, the capabilities of the current particle monitoring technologies can barely monitor particles larger than 20 nm, which lag far behind the industry need. Innovative Nanotech launched an in-line nanoparticle monitoring system, SuperSizer, to detect accurately and efficiently the size and distribution of nanoparticles less than 20 nm. SuperSizer is designed to work 24/7 to improve the purity of the wet chemicals and fabrication yield of semiconductor production.

SoC Test System for Smart Network
AI data analysis, big data statistics, voice identification, and network security are the keys to make home smarter and more convenient. In recent year, Chroma has been aggressively developing the equipment to test SoC chips used in the smart home ecosystems by providing highly integrated measurement solution to satisfy the low cost and complex SoC test requirements.

The HDAVO (High Density Audio Video Option) is an optional mixed-signal module that can provide source and capture test capabilities with Arbitrary Waveform Generator (AWG) and Digitizer (DGT) functions when integrated into an audio recognition SoC test system. The module has 8 AWG and 8 digitizers on an instrument board with sampling rate up to 400Msps for each AWG and 250Msps for each DGT. The advantages of high specification, low cost and multi-functional make it suitable for a wide range of mixed signals tests and even applicable for I/Q signals development for the future 5G baseband chips. The CRISPro software environment provides a powerful tool for the users to edit or debug the test programs quickly and easily via a Graphic User Interface (GUI). The supported concurrent testing function not only reduces the programming time but also accelerates the production speed.

IoT Connectivity Test Solution
With its versatile wireless measurement technologies, the MP5806 RF tester is readily integrated into the classical portfolio of Chroma semiconductor test equipment, offering an upgrade option of RFIC testing for the pre-existing Chroma VLSI / SoC test systems in addition to their essential capabilities in testing digital, analog, or mixed-signal IC. Developed by Adivic Technology in Chroma Group, the MP5806 RF tester supports major Internet of Things (IoT) wireless standards such as NB-IoT, GPS/BeiDou, Wi-Fi, Bluetooth, tuner, and others. Its broadband VSG/VSA module with 10MHz~6GHz full-frequency coverage can comprehensively cover future wireless standards.

PXIe Digital I/O Card with ATE Function
The Chroma 33010 PXIe Digital I/O Card provides automatic test functions based on PXIe architecture to meet the coming demand of PXI testing. To satisfy smaller IC channels and increasingly complex test functions, especially on IoT and automotive electronics IC, the PXI/PXIe architecture in semiconductor tests offers advantages of diversity and flexibility in MCU, MEMS, RF IC and PMIC testing. It is also feasible for porting to Chroma 3380D (256 channels), Chroma 3380P (512 channels) and Chroma 3380 (1024 channels) for mass-production as they have high similarity in both software and hardware.

SEMICON Taiwan 2018 will be held from September 5~7, and Chroma will show the newest semiconductor/IC test solutions at the Taipei Nangang Exhibition Hall 1 (Booth No. K2785) with many more customized solutions to fulfill your requirements. We welcome you to experience new trends in test and measurement, and look forward to meeting you at this annual event.

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SuperSizer Nanoparticle Monitoring System

For more information please check at SEMICON TAIWAN 2018