ITC – The world’s Most Influential Professional Testing Technology Conference Held in Asia for the First Time

Chroma ATE Inc. was invited as one of the opening keynote speakers to address the convergence of electronic and semiconductor systems, and its impact on testing technology

The ITC-Asia (International Test Conference) successfully held on September 13-15 in Taipei, was a flagship conference in test technology. It gathered the IC test and design professionals around the world to confront the challenges the industry faces, and learn how these challenges are being addressed. The conference was dedicated to the process and design improvement of software and hardware – covering design verification, test, diagnosis, failure analysis, components, systems and application software.

To cope with the needs of complex process and system integration derived from IoT, cloud computing, automotive electronics and other emerging applications, the ITC moved to Asia for the first time and co-located with SEMICON Taiwan in 2017. The conference linked the supply chains from semiconductor design in the beginning to IC packaging and testing at the end to boost collaborations in creating more potential business opportunities. Three days of consecutive keynote speeches, industry topics, call for papers and technical courses, explored and analyzed the latest test technology trends with focuses on popular topics including the newest IoT, automotive electronic testing methods and safety standards, as well as the advanced multi chip packaging test and repair technologies.

I-Shih Tseng, the ISS BU general manager of Chroma ATE Inc. was invited as one of the keynote speakers in the opening to discuss the semiconductor testing technology from the perspective of a testing equipment supplier. While we enjoy the convenience and brand new experience brought by high-tech, it is a huge challenge for semiconductor chip producers and test equipment providers as the test is no longer just electronic and circuit testing, but different applications associated with many aspects such as mechanical, optical components, temperature, and even chemical composition.

I-Shih Tseng, the ISS BU general manager of Chroma ATE Inc.
▲I-Shih Tseng, the ISS BU general manager of Chroma ATE Inc.

Semiconductor test has evolved to a level of safety, responsibility and reliability. The IC quality is absolutely important for self-driving cars because it concerns personal safety. When the car is driving in different environments, the temperature can change from high heat to freezing as well as high winds and rain all make the IC chip’s reliability a necessity. Moreover, for new applications, such as in VCSEL 3D image sensing, it has to be sure that it is no harm to people. All of these new applications provide a challenge to chip manufacturers and test equipment manufacturers for their ability to keep the car safe for drivers.

This means that semiconductor test equipment manufacturers need to work with customers earlier in the design process. Chroma ATE has been a Turnkey Solution provider with core technology in measurement since 2011, and is the only manufacturer equipped with testing and automation capability. Chroma’s products are mainly used in communication (FPD, color and video, optical components, power electronics, passive components, electrical safety, thermoelectric temperature control and automatic optics), semiconductor/IC, and clean technology (EV, green battery, LED lighting and solar energy) industries to effectively improve the quality of customer products and production efficiency in helping customers enhance their competitiveness.

Chroma has many product lines to fulfill the needs of semiconductor testing by supplying various kinds of equipment from R&D to mass production such as large ATE test systems, sorting machines and compact PXI test platforms, all of them have complete corresponding products to give customers the most appropriate selection. The complete semiconductor solution of Chroma covers different wafer test applications including consumer chips (microprocessors, audio chips, computers/mobile peripherals, etc.), power chips (linear regulators, DC converters, AC converters, LED drivers, etc.), radio frequency chips (wireless network, blue, blue, etc.), power chips (such as microprocessors, audio chips, computers / mobile peripherals, etc.), RF chips (wireless network, Bluetooth, mobile communication, etc.), and chips for specific testing areas (image sensors, radio frequency identification, etc.)

New IoT applications Initiate comprehensive semiconductor testing needs

Internet of Things (IoT) digitizes the real world by narrowing the scattered information and consolidating the digital information of things. It has a broad market and application prospects that is structured in three layers; sensing, network and application. Ranging from logistics and transportation, health care, smart environment (home, office and factory) along with personal and social areas, almost anything can be closely related to IoT. The IoT chip has been widely used in network and various types of sensors. For different applications in a test environment, the way to ensure that each IC’s function, performance and quality meet the standard is specifically important. Chroma’s Semiconductor BU general manager, George Chang, indicated that to cope with diversified applications, semiconductor wafer testing must incorporate a variety of test items including temperature, radio frequency (RF), precision and speed, to meet all types of IoT applications and customer needs.

Chroma provides complete semiconductor test solutions including SoC / VLSI/ Analog test solutions, IC test handlers, PXI IC test platforms and equipment corresponding to various types of IoT applications in testing embedded processor, MCU, RF MUC, Light Sensor, Magnetic Sensor, G-Sensor/Gyro, CMOS Image Sensor, Finger Print Sensor, Laser Diode, PMIC), and diversified wireless network implementation.

The widespread use of IoT creates a huge demand for micro control units and sensors, which lead to fierce competition in cost and production. As electronic products are always aiming for high cost-performance ratio with better functionality, Chroma is capable of providing competitive test instruments that are flexible to integrate with other equipment and automated systems to meet the demands for increased testing requirements and cost savings.

AI, smart driving, system level and burn-in test ensure final quality of IC

In light of the evolution of semiconductor process and packaging technology, the capabilities of ICs used in consumer electronics, automobiles, internet of things and artificial intelligence are getting more powerful with increased packaging density. Herbert Tsai, the ISS BU deputy general manager of Chroma ATE Inc. pointed out that for the complex packaging products such as SoC/SIP/3D ICs, besides inspecting the power and signal through traditional automated test equipment (mixed single ATE), the System Level Test (SLT) and Burn-in (BI) inspection process are also applied to do a comprehensive testing on IC to ensure its final quality.

As the IoV (internet of vehicle) and smart driving are growing trends, many car manufacturers have implemented ESC (electronic stability control) systems to receive and send signals through the sensor, camera, lidar and RF equipped on the car. When the system has collected the information from each component, it will quickly analyze and evaluate the vehicle status, and give commands to correct the steering wheel, slow down, brake or alarm. This means the system must have powerful semiconductor components to support the overall operation. These automotive systems have to remain in normal operation even under extreme conditions as they are related to driving safety. For varied driving environments, the demand for tri-temperature system level testing (Tri temperature SLT) on car chips is rapidly emerging. The product quality of car chips can be assured after rigorous and long-hour high/low temperature testing.

In recent years, the development of AI chips has been the frontline of first-tier manufacturers. The development of artificial intelligence at this stage is based on parallel computing technology and the depth of deep learning. Through the robust capabilities of self-learning and computing inside the chip, the equipment or systems are able to react properly in time. However, these types of high level chips (GPU/FPGA) are very expensive with strict quality demands, and passing through long hours of SLT/Burn-in test is the way to guarantee that every chip can operate normally under high temperature and high voltage environments.

Chroma has been dedicated to FT / SLT Handler technology research and development for a long time. In addition to the desktop equipment for the design house, Chroma also provides multi-functional and efficient test equipment for designers to use. Moreover, Chroma has introduced multi-probe tri-temperature test equipment to satisfy customer’s demand for mass production. The test technologies proprietary to Chroma can also be customized to meet customer needs providing the best test solutions.

 

New Solution for Chroma user

We have a new release of mobile application, This APP is to help users quickly find their own product catalog and support offline features. Enjoy ~ We giving the best solutions for all Chroma user.

 ATE Solution

Chroma ATE – Turnkey Test & Automation Solutions

Universal Business

iOS | Android 安卓应用

Find test solutions you need and nearby Chroma ATE service locations
– Solutions list drop-down
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Founded in 1984, Chroma ATE Inc. is a world leading supplier of precision Test and Measurement Instrumentation, Automated Test Systems, Intelligent Manufacturing Systems and Turnkey Test and Automation Solutions marketed globally under the brand name “Chroma”.

Significant markets Chroma serves include LED, photovoltaic, Li-battery, electric vehicle, semiconductor/IC, optical device, flat panel display, video and color, power electronics, passive component, electrical safety, and thermoelectric test, as well as automated optical inspection and Intelligent Manufacturing Systems for ICT, clean technology, and smart factory.

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Chroma will exhibit Multiple Optical Test Solutions in OPTO Taiwan – Booth: J1016

Chroma ATE Inc., a world leading supplier of precision Test and Measurement Instrumentation, Automated Test Systems, Intelligent Manufacturing Systems, Turnkey Test and Automation Solutions will exhibit its newest laser diode, video and color along with solar photoelectric automatic optical test solutions in the 26th International Optoelectronics Exposition in Taiwan in June.

Lately the laser diode has been used widely in human face recognition, autonomous driving, and optical communications. The quality and reliability of laser diodes are getting more important as the demand increases. The Chroma 58604 Laser Diode Burn-in and Reliability Test System provides bi-directional SMU function allowing users to switch the mode when performing long-term reliability test in the optical devices. The Chroma 58620 Laser Diode Characterization System is all-in-one design integrating optics, electrics and temperature control into the system for users to specify the test conditions as desired. Moreover, Chroma also developed laser diode VCSEL testing equipment for 3D sensing applications using its unique and innovative technology.

Aiming to the ultra-high resolution video broadcast technology that will be put in service in the 2020 Tokyo Olympic Games, Chroma has launched an 8K SHV (Super-Hi Vision) test solution to fulfill the testing requirement for 8K (7680×4320 / 8192 x 4320) ultra-high definition from panel and display industries. This solution adopts modular design with different signals or power modules to meet the diversified test requirements. It has high flexibility, wide scalability, and supports a variety of mainstream industry communication interfaces. The Chroma 2918 supports full 8K@60/120Hz resolution, with the unique FPD Master, GO/NO GO software for fast editing and testing process. The Chroma 2238, supporting resolutions up to 8K@60Hz, has an intuitive and user-friendly graphical touch panel and software UI, providing users a smoother operation experience. Furthermore, it also carries a separate graphics engine that can output a maximum of four different resolutions and test patterns at the same time.

The Chroma 7200 Series solar cell and wafer automatic test solution is designed to inspect the wafer and cell defects on the solar cell production line. With Chroma’s smart factory solution, it can meet customer’s demand for low-cost production. The Chroma 7200 test solution can inspect solar cells or wafers for 6″ size, and detect single crystal, polycrystalline or even single-crystal products. According to the production process requirement, this system can integrate 8 kinds of AOI machines with different functions to perform wafer feed inspection, anti-reflective film color test, silk screen printing inspection and cell shipping classification inspection, etc.

The 26th International Optoelectronics Exposition will take place on June 14-16, 2017 at the TWTC Nangang Exhibition Hall in Taipei. Chroma will be exhibiting multiple optical test solutions in the exposition at booth: J1016. We sincerely invite you to experience the new trend of measurement and look forward to meeting you at this annual event.

For more information about Chroma’s products, visit us

Chroma ATE Inc.