Chroma ATE Inc., a world leading supplier of precision Test and Measurement Instrumentation, Automated Test Systems, Intelligent Manufacturing Systems, Turnkey Test and Automation Solutions will exhibit its newest laser diode, video and color along with solar photoelectric automatic optical test solutions in the 26th International Optoelectronics Exposition in Taiwan in June.
Lately the laser diode has been used widely in human face recognition, autonomous driving, and optical communications. The quality and reliability of laser diodes are getting more important as the demand increases. The Chroma 58604 Laser Diode Burn-in and Reliability Test System provides bi-directional SMU function allowing users to switch the mode when performing long-term reliability test in the optical devices. The Chroma 58620 Laser Diode Characterization System is all-in-one design integrating optics, electrics and temperature control into the system for users to specify the test conditions as desired. Moreover, Chroma also developed laser diode VCSEL testing equipment for 3D sensing applications using its unique and innovative technology.
Aiming to the ultra-high resolution video broadcast technology that will be put in service in the 2020 Tokyo Olympic Games, Chroma has launched an 8K SHV (Super-Hi Vision) test solution to fulfill the testing requirement for 8K (7680×4320 / 8192 x 4320) ultra-high definition from panel and display industries. This solution adopts modular design with different signals or power modules to meet the diversified test requirements. It has high flexibility, wide scalability, and supports a variety of mainstream industry communication interfaces. The Chroma 2918 supports full 8K@60/120Hz resolution, with the unique FPD Master, GO/NO GO software for fast editing and testing process. The Chroma 2238, supporting resolutions up to 8K@60Hz, has an intuitive and user-friendly graphical touch panel and software UI, providing users a smoother operation experience. Furthermore, it also carries a separate graphics engine that can output a maximum of four different resolutions and test patterns at the same time.
The Chroma 7200 Series solar cell and wafer automatic test solution is designed to inspect the wafer and cell defects on the solar cell production line. With Chroma’s smart factory solution, it can meet customer’s demand for low-cost production. The Chroma 7200 test solution can inspect solar cells or wafers for 6″ size, and detect single crystal, polycrystalline or even single-crystal products. According to the production process requirement, this system can integrate 8 kinds of AOI machines with different functions to perform wafer feed inspection, anti-reflective film color test, silk screen printing inspection and cell shipping classification inspection, etc.
The 26th International Optoelectronics Exposition will take place on June 14-16, 2017 at the TWTC Nangang Exhibition Hall in Taipei. Chroma will be exhibiting multiple optical test solutions in the exposition at booth: J1016. We sincerely invite you to experience the new trend of measurement and look forward to meeting you at this annual event.
For more information about Chroma’s products, visit us
Chroma ATE Inc.