Chroma Test Equipment Designated by IFEC 2017 for Power Supply Competition

<Note: This article was released on September 6>
The IFEC, initiated by IEEE, is an international student competition for innovation, conservation, and effective use of electrical energy, which is open to college and university student teams from recognized engineering programs in any location.

Chroma, the world’s leading manufacturer of test instrumentation, has been the only official designated equipment sponsor for three consecutive years and recently participated in the competition held at the Virginia Polytechnic Institute in the United States. A Chroma 8000 Automated Test System (ATS) was customized to perform the test items for the competition where students were to create high efficiency, high density isolated DC-DC converters. The data measured by the Chroma 8000 ATS was used as the evaluation criteria and the test items are summarized as below:

Test Items Measurements
Steady State Test Output boltage, ripple voltage, efficiency
Load Transient Response Test Output voltage waveform, positive/negative overshoot voltage
Burn-in Test Output voltage, ripple voltage, efficiency

To cope with the competition requirements for high accuracy and high current slew, the 8000 ATS was equipped Chroma’s 63600 Series high precision electronic load with a sampling rate of up to 500k Hz and a 2A/µs current slew rate. Combined with the open software architecture of the Chroma 8000 ATS, a complete test report was generated to give the judges an important reference to rate the competition entries.

IFEC2017-Chroma ATS 8000
▲Chroma 8000 ATS Used by IFEC 2017

With more than 30 years of experience in precision instrumentation, Chroma is a leader of automated test systems specialized in a variety of power electronics testing. To adapt to new energy development, Chroma has been actively developing test solutions for solar energy, electric vehicles, and battery packs industries to satisfy their customer’s demands.

Chroma was proud of contributing the industry experience in this international energy design competition and will continue to sponsor the 2018 IFEC helping to nurture the future elite in the field of electronics. The IFEC 2017 competition results will be announced on the IFEC official website soon. For detailed information, please refer to the URL below:

IFEC Official Website: http://energychallenge.weebly.com/

 

Chroma 8000 ATS

Chroma ATE Invested Innovative Nanotech Inc. with Technology Transfer from ITRI to Advancing in Semiconductor Front-end Process Inspection

TAOYUAN, Taiwan, Nov. 24, 2017 — Innovative Nanotech Inc., invested by Chroma ATE Inc., signed a contract with Industrial Technology Research Institute (ITRI) on Nov. 24 for “Nanoparticles Monitoring Technology” transfer. In addition, ITRI will serve as an important shareholder of Innovative Nanotech. Just a short time ago Innovative Nanotech had been contracted with Hsinchu Science Park for the purpose of developing and creating liquid nanoparticle monitoring systems used in the semiconductor manufacturing process to help improve the yield rate.

ITRI
Figure:Chroma ATE Inc. CEO Leo Huang (right) signed a contract with Industrial Technology Research Institute (ITRI) on Nov. 24 for “Nanoparticles Monitoring Technology” transfer to Chroma’s new startup company, Innovative Nanotech Inc.

Large amount of liquid solutions are often used to clean, grind and etch the wafer surface during the semiconductor manufacturing process and impurities in the solution have an impact on the defect rate. Light scattering particle measurement technology currently cannot precisely detect the size and quantity of solution particles under 20nm, which makes it difficult in controlling the manufacturing process. Also, with development from 20nm to 10nm and even to 7nm, the minimized transistors make the width of current path narrow; therefore, when impurities like nanoparticles appear in solution, it will affect the defect-free rate of the product.

Innovative Nanotech will introduce to semiconductor manufacturers a new generation nanoparticle monitoring system, SuperSizer, which will accurately detect the size and quantity of particles above 5nm. This will allow manufacturers to take necessary measures to improve the process according to the monitored results. In addition to the semiconductor manufacturing process, this technology can also be applied to electronics, optoelectronics, and biomedical materials fields.

Innovative Nanotech will expand to a global market by incorporating the sales and marketing channels of Chroma group. Chroma ATE Inc. is a world leading supplier of Automated Test Systems, Intelligent Manufacturing Systems, Turnkey Test and Automation Solutions and has a number of back-end precision measurement product lines in the semiconductor testing field. Innovative Nanotech will become Chroma’s semiconductor front-end process testing solutions provider to satisfy the testing requirements of a complete semiconductor manufacturing process.

Chroma ATE Inc.

Chroma Receives the International Trade Award for Best Contribution from the Ministry of Economic Affairs

Chroma ATE Inc. is a world leading supplier of precision Test and Measurement Instrumentation, Automated Test Systems, Intelligent Manufacturing Systems and Turnkey Test and Automation Solutions based in Taiwan and marketed globally under the brand name “Chroma.” With continued success in sales, Chroma received the International Trade Award for Best Contribution 2016 as one of the outstanding enterprises in expanding the development of economic and trade for export and import.

Trade Award Price
William Chang, Special Assistance to the President of Chroma (middle) receives the International Trade Award for Best Contribution 2016 from Jen-Ni Yang, Director General of the Bureau of Foreign Trade (left) and Walter Yeh, Secretary General of Taiwan External Trade Development Council (right)

Chroma achieved NT$ 7.23 billion in revenue in 2016. 75% of the revenue came from exporting measurement and automated test equipment and Turnkey Solutions to global first tier customers in testing electric vehicles, li-ion batteries, semiconductors and optical components. Chroma’s products are mainly used in information and communications, semiconductor and clean technology industries for R&D, manufacturing and quality control. After years of development and integration of automation and MES technologies, Chroma has become a Turnkey Solution provider that has both measurement techniques and automation capabilities to effectively improve customer’s products quality and production efficiency in helping them increase their competitiveness.

Chroma envisions developing global leading products as a world-class enterprise. To achieve this, Chroma devotes a significant amount of resources in R&D in order to provide exceptional products of precision and reliability as well as valuable unique test solutions for technology industries. To sustain as a world-class enterprise, Chroma nurtures its brand as one of innovation, continuous improvement and globalization ensuring its leading technologies and integration capabilities in optics, mechanics, electronics, thermal control and software provide competitive advantages and future growth for the company.

With branch offices around the world chartered to deliver innovative technologies and high value-added services to satisfy customer demands, Chroma will continue to increase the export share of Europe, the United States, Japan and Southeast Asia in balancing the global market revenue to create greater trade momentum for Taiwan.

Chroma ATE Inc.

 

ITC – The world’s Most Influential Professional Testing Technology Conference Held in Asia for the First Time

Chroma ATE Inc. was invited as one of the opening keynote speakers to address the convergence of electronic and semiconductor systems, and its impact on testing technology

The ITC-Asia (International Test Conference) successfully held on September 13-15 in Taipei, was a flagship conference in test technology. It gathered the IC test and design professionals around the world to confront the challenges the industry faces, and learn how these challenges are being addressed. The conference was dedicated to the process and design improvement of software and hardware – covering design verification, test, diagnosis, failure analysis, components, systems and application software.

To cope with the needs of complex process and system integration derived from IoT, cloud computing, automotive electronics and other emerging applications, the ITC moved to Asia for the first time and co-located with SEMICON Taiwan in 2017. The conference linked the supply chains from semiconductor design in the beginning to IC packaging and testing at the end to boost collaborations in creating more potential business opportunities. Three days of consecutive keynote speeches, industry topics, call for papers and technical courses, explored and analyzed the latest test technology trends with focuses on popular topics including the newest IoT, automotive electronic testing methods and safety standards, as well as the advanced multi chip packaging test and repair technologies.

I-Shih Tseng, the ISS BU general manager of Chroma ATE Inc. was invited as one of the keynote speakers in the opening to discuss the semiconductor testing technology from the perspective of a testing equipment supplier. While we enjoy the convenience and brand new experience brought by high-tech, it is a huge challenge for semiconductor chip producers and test equipment providers as the test is no longer just electronic and circuit testing, but different applications associated with many aspects such as mechanical, optical components, temperature, and even chemical composition.

I-Shih Tseng, the ISS BU general manager of Chroma ATE Inc.
▲I-Shih Tseng, the ISS BU general manager of Chroma ATE Inc.

Semiconductor test has evolved to a level of safety, responsibility and reliability. The IC quality is absolutely important for self-driving cars because it concerns personal safety. When the car is driving in different environments, the temperature can change from high heat to freezing as well as high winds and rain all make the IC chip’s reliability a necessity. Moreover, for new applications, such as in VCSEL 3D image sensing, it has to be sure that it is no harm to people. All of these new applications provide a challenge to chip manufacturers and test equipment manufacturers for their ability to keep the car safe for drivers.

This means that semiconductor test equipment manufacturers need to work with customers earlier in the design process. Chroma ATE has been a Turnkey Solution provider with core technology in measurement since 2011, and is the only manufacturer equipped with testing and automation capability. Chroma’s products are mainly used in communication (FPD, color and video, optical components, power electronics, passive components, electrical safety, thermoelectric temperature control and automatic optics), semiconductor/IC, and clean technology (EV, green battery, LED lighting and solar energy) industries to effectively improve the quality of customer products and production efficiency in helping customers enhance their competitiveness.

Chroma has many product lines to fulfill the needs of semiconductor testing by supplying various kinds of equipment from R&D to mass production such as large ATE test systems, sorting machines and compact PXI test platforms, all of them have complete corresponding products to give customers the most appropriate selection. The complete semiconductor solution of Chroma covers different wafer test applications including consumer chips (microprocessors, audio chips, computers/mobile peripherals, etc.), power chips (linear regulators, DC converters, AC converters, LED drivers, etc.), radio frequency chips (wireless network, blue, blue, etc.), power chips (such as microprocessors, audio chips, computers / mobile peripherals, etc.), RF chips (wireless network, Bluetooth, mobile communication, etc.), and chips for specific testing areas (image sensors, radio frequency identification, etc.)

New IoT applications Initiate comprehensive semiconductor testing needs

Internet of Things (IoT) digitizes the real world by narrowing the scattered information and consolidating the digital information of things. It has a broad market and application prospects that is structured in three layers; sensing, network and application. Ranging from logistics and transportation, health care, smart environment (home, office and factory) along with personal and social areas, almost anything can be closely related to IoT. The IoT chip has been widely used in network and various types of sensors. For different applications in a test environment, the way to ensure that each IC’s function, performance and quality meet the standard is specifically important. Chroma’s Semiconductor BU general manager, George Chang, indicated that to cope with diversified applications, semiconductor wafer testing must incorporate a variety of test items including temperature, radio frequency (RF), precision and speed, to meet all types of IoT applications and customer needs.

Chroma provides complete semiconductor test solutions including SoC / VLSI/ Analog test solutions, IC test handlers, PXI IC test platforms and equipment corresponding to various types of IoT applications in testing embedded processor, MCU, RF MUC, Light Sensor, Magnetic Sensor, G-Sensor/Gyro, CMOS Image Sensor, Finger Print Sensor, Laser Diode, PMIC), and diversified wireless network implementation.

The widespread use of IoT creates a huge demand for micro control units and sensors, which lead to fierce competition in cost and production. As electronic products are always aiming for high cost-performance ratio with better functionality, Chroma is capable of providing competitive test instruments that are flexible to integrate with other equipment and automated systems to meet the demands for increased testing requirements and cost savings.

AI, smart driving, system level and burn-in test ensure final quality of IC

In light of the evolution of semiconductor process and packaging technology, the capabilities of ICs used in consumer electronics, automobiles, internet of things and artificial intelligence are getting more powerful with increased packaging density. Herbert Tsai, the ISS BU deputy general manager of Chroma ATE Inc. pointed out that for the complex packaging products such as SoC/SIP/3D ICs, besides inspecting the power and signal through traditional automated test equipment (mixed single ATE), the System Level Test (SLT) and Burn-in (BI) inspection process are also applied to do a comprehensive testing on IC to ensure its final quality.

As the IoV (internet of vehicle) and smart driving are growing trends, many car manufacturers have implemented ESC (electronic stability control) systems to receive and send signals through the sensor, camera, lidar and RF equipped on the car. When the system has collected the information from each component, it will quickly analyze and evaluate the vehicle status, and give commands to correct the steering wheel, slow down, brake or alarm. This means the system must have powerful semiconductor components to support the overall operation. These automotive systems have to remain in normal operation even under extreme conditions as they are related to driving safety. For varied driving environments, the demand for tri-temperature system level testing (Tri temperature SLT) on car chips is rapidly emerging. The product quality of car chips can be assured after rigorous and long-hour high/low temperature testing.

In recent years, the development of AI chips has been the frontline of first-tier manufacturers. The development of artificial intelligence at this stage is based on parallel computing technology and the depth of deep learning. Through the robust capabilities of self-learning and computing inside the chip, the equipment or systems are able to react properly in time. However, these types of high level chips (GPU/FPGA) are very expensive with strict quality demands, and passing through long hours of SLT/Burn-in test is the way to guarantee that every chip can operate normally under high temperature and high voltage environments.

Chroma has been dedicated to FT / SLT Handler technology research and development for a long time. In addition to the desktop equipment for the design house, Chroma also provides multi-functional and efficient test equipment for designers to use. Moreover, Chroma has introduced multi-probe tri-temperature test equipment to satisfy customer’s demand for mass production. The test technologies proprietary to Chroma can also be customized to meet customer needs providing the best test solutions.

 

Chroma’s 17040 regenerative battery pack test system reduces power consumption and provides dual modes for battery charge/discharge test and battery simulation to test battery connected devices.

Chroma ATE Inc., a leading provider of power conversion test equipment, announces the release of the 17040 Regenerative Battery Pack Test System. The 17040 test system is a high precision system specifically designed for secondary battery module and pack tests as well as battery simulation. It has a regenerative function to greatly reduce power consumption during discharge and ensure a stable power grid without generating harmonic pollution on other devices even in dynamic charge and discharge conditions. It is capable of recycling the energy discharged (Eff. >90%, PF >0.95, I_THD <5%) back to the grid reducing wasted energy that is discharged traditionally in the form of heat resulting in reduced HVAC requirements. The 17040 is available in four voltage (up to 1,000VDC) and current ranges with auto ranging, high accuracy current/voltage measurement (±0.05%FS/±0.02%FS), 2ms current slew rate, and 1ms data acquisition.

product_slider_17040

Chroma’s 17040’s also have built in parallel channels and dynamic profile simulation functions. The parallel capability increases the charge and discharge current and power to its maximum, increasing its efficiency and flexibility. The dynamic profile simulation allows the user to load a battery waveform of a given drive profile in either current or power mode to meet NEDC/FUDS requirements. Its bi-directional architecture ensures that current will not be interrupted during the charge and discharge transition state so it provides an accurate simulation of driving conditions in line with ISO, IEC, UL and GB/T international testing standards.

The Battery Simulation mode is featured to test battery connected devices. When a connected device is under development, the 17040 can simulate the battery to verify whether or not the device is functioning as designed. In addition, the 17040 can control the SOC status of different batteries. Users can upload required battery curves to test the DUT for charge and discharge status. The 17040 can also perform battery and DUT collocation evaluation tests in advance that apply to the motor driver for vehicle start-stop systems, light EV electronic controllers, car mounted chargers, etc.

Multiple safety features are built in to the system including Over Voltage Protection, Over Current Protection Check, Over Temperature Protection, and external parameter detection to ensure protected charge/discharge testing on the batteries. Additionally, data loss, storage and recovery are protected against power failure.

Chroma’s Battery Pro software provides users with flexible test editing functions to perform independent channel tests, detailed reports in customizable formats, and abilities to meet various requirements of battery packs with high safety and stability. Software/hardware integration and customization capabilities include BMS, data loggers, chambers, external signals, and HIL (Hardware in the Loop).


(Battery simulator main panel, DCR setting, Battery characteristics V-SOC curve setting screen)

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Chroma will exhibit Multiple Optical Test Solutions in OPTO Taiwan – Booth: J1016

Chroma ATE Inc., a world leading supplier of precision Test and Measurement Instrumentation, Automated Test Systems, Intelligent Manufacturing Systems, Turnkey Test and Automation Solutions will exhibit its newest laser diode, video and color along with solar photoelectric automatic optical test solutions in the 26th International Optoelectronics Exposition in Taiwan in June.

Lately the laser diode has been used widely in human face recognition, autonomous driving, and optical communications. The quality and reliability of laser diodes are getting more important as the demand increases. The Chroma 58604 Laser Diode Burn-in and Reliability Test System provides bi-directional SMU function allowing users to switch the mode when performing long-term reliability test in the optical devices. The Chroma 58620 Laser Diode Characterization System is all-in-one design integrating optics, electrics and temperature control into the system for users to specify the test conditions as desired. Moreover, Chroma also developed laser diode VCSEL testing equipment for 3D sensing applications using its unique and innovative technology.

Aiming to the ultra-high resolution video broadcast technology that will be put in service in the 2020 Tokyo Olympic Games, Chroma has launched an 8K SHV (Super-Hi Vision) test solution to fulfill the testing requirement for 8K (7680×4320 / 8192 x 4320) ultra-high definition from panel and display industries. This solution adopts modular design with different signals or power modules to meet the diversified test requirements. It has high flexibility, wide scalability, and supports a variety of mainstream industry communication interfaces. The Chroma 2918 supports full 8K@60/120Hz resolution, with the unique FPD Master, GO/NO GO software for fast editing and testing process. The Chroma 2238, supporting resolutions up to 8K@60Hz, has an intuitive and user-friendly graphical touch panel and software UI, providing users a smoother operation experience. Furthermore, it also carries a separate graphics engine that can output a maximum of four different resolutions and test patterns at the same time.

The Chroma 7200 Series solar cell and wafer automatic test solution is designed to inspect the wafer and cell defects on the solar cell production line. With Chroma’s smart factory solution, it can meet customer’s demand for low-cost production. The Chroma 7200 test solution can inspect solar cells or wafers for 6″ size, and detect single crystal, polycrystalline or even single-crystal products. According to the production process requirement, this system can integrate 8 kinds of AOI machines with different functions to perform wafer feed inspection, anti-reflective film color test, silk screen printing inspection and cell shipping classification inspection, etc.

The 26th International Optoelectronics Exposition will take place on June 14-16, 2017 at the TWTC Nangang Exhibition Hall in Taipei. Chroma will be exhibiting multiple optical test solutions in the exposition at booth: J1016. We sincerely invite you to experience the new trend of measurement and look forward to meeting you at this annual event.

For more information about Chroma’s products, visit us

Chroma ATE Inc.

Chroma’s Battery Production Line Automated Test Solution Adopted by Famous Automotive Manufacturers in China

Chroma ATE Inc. is a world leading supplier of precision Test and Measurement Instrumentation, Automated Test Systems, Intelligent Manufacturing Systems, and Turnkey Test and Automation Solutions. In recent years, Chroma has been actively cultivating the electric vehicle (EV) testing market, and its newly launched lithium battery pack end-of-line (EOL) automated test solution has been successfully adopted by several of China’s well-known automotive manufacturers. Our solution provides safe, real-time monitoring of the test process and saves up to 6 times the inspection time, significantly reducing the production cost.

Once an automotive manufacturer completes the selection of battery cells and battery pack design, as well as development, it then faces bottlenecks in cost and speed during the process of mass production. The safety of EV battery pack production must be taken seriously as the process encompasses potential danger of high voltage and high energy density. Using an automatic battery inspection system can reduce production costs and improve the throughput effectively, and also ensures the safety of the entire fabrication process. Moreover, manual tests can cause inconsistent results, handwritten data errors, long testing hours, product traceability problems and more. At present, automotive manufacturers request that the EOL test for the finished battery packs before shipment takers 10 ~ 20 min/pcs with real-time monitoring, automatic reporting of traceability, and security protection mechanisms. Hence, the modular and automated test solution has been gradually adopted by many automotive manufacturers for battery production.

 Model 8700ATS Battery Pack Automatic Test System▲  Model 8700ATS Battery Pack Automatic Test System

The testing functions applied by the lithium battery pack EOL automated test system encompasses mechanical assembly, high voltage insulation, battery management system (BMS) communication, internal on/off switches, battery unbalance, and temperature distribution, etc. The comprehensive PASS/FAIL tests can be used not only for production line but also for R&D near completion phase or battery pack feeding inspection. Automated testing avoids personal misuse and ensures the safety of operators, which is applicable for the battery modules of electric cars, electric motorcycles and energy storage systems. The main features and specifications of Chroma’s battery pack automated test system are listed below:

  • For battery module production or R & D unit test verification use.
  • Improve product inspection efficiency.
  • Test the battery module for BMS function / connector withstand voltage / consistency / performance.
  • Charge and discharge power range: 5kW ~ 500kW.
  • Charge and discharge power/current range:0V~1200V/0A~2600A.
  • Standard test items include: Insulation test, electrical test, software/communication test and battery performance test.
  • Capable of providing customized fixtures to connect the battery modules with automatic control switching function.

The lithium battery pack EOL automated test system can integrate with Chroma’s electrical safety analyzers, switching fixtures, digital meters, and regenerative charge/discharge test systems through an open software platform for diversified testing applications. With the support of Shop-Floor programs and MES handshakes, it is easy to integrate data incorporation and tracking. The test system can also handle different automated production line requirements for PLC, MES, and security mechanisms to provide a more complete customized automated test station.

With 30 years of experience in test and measurement instrumentation, Chroma is able to provide a wide variety of test solutions for power and storage batteries. These include: regenerative battery pack test systems for battery cells, battery modules, and battery packs; BMS test systems; battery pack EOL auto test systems; battery simulators; and super capacitors. These solutions are in use worldwide by manufacturers and third party laboratories.

For any questions regarding these battery test solutions, please provide your contact information. We will reach out to you for further service.

Battery Test Solutions