Chroma Collaborates with the National Taiwan University of Science and Technology to Help Improve Al and Green Industry Technologies

On March 26th, 2018, Chroma ATE Inc. collaborated with the National Taiwan University of Science and Technology (NTUST) to hold a signing ceremony in efforts to engage the electronics industry to actively participate in an international industrial-academic alliance. The organizations seek to advance the research and development of innovated technologies associated with sustainable energy, AI artificial intelligence, smart manufacturing, etc.

Since 2015, Chroma has invested over 15 million NT dollars along with other various instrumental equipment (valued at 4.2 million NT dollars) to the Chroma NTUST R&D Center in efforts to help cultivate the academic aptitudes of NTUST students.


Benjamin Huang (left), Deputy GM of Chroma, and Ching-Jong Liao (right), president of NTUST, in the signing ceremony of the cooperation agreement. (Photo provided by NTUST)

Ching-Jong Liao, President of the NTUST, stated that the university is capable of customizing multiple solutions to different business demands by providing the research and development necessary to the AI and green industries. Liao plans on further expanding industrial-academic relationships to the global level by broadening the markets of domestic manufacturers internationally and linking R&D energy with transnational scientific research institutions and industries.

For many years, the NTUST has been actively collaborating with Germany, United States, and Japan in the industrial-academic movements. In addition, the university holds a great deal of alumni resources spanning internationally from countries including the United States, Indonesia, Vietnam, and Ethiopia who are assets in promoting industrial-academic cooperation.

As a world-leading supplier of precision Test and Measurement Instrumentation, Automated Test Systems, Smart Manufacturing System, and SmartAuto Total Turnkey Solutions, Chroma invests a significant amount of resources into R&D. This substantial investment of resources ensures that Chroma remains competitive on the forefront of leading technologies and integration capabilities in the optics, mechanics, electronics, thermal control, and software industries. And with the help of the NTUST, Chroma is able to quickly grow as an organization that continues to develop and harness advanced technologies.

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A Productive Utility for New Energy Vehicle LV123 Standards Tests Chroma High Voltage DC Power Supply Test Software

Complying with global energy conservation trends and policies driven by international governments, many automakers have released technical development standards for next generation vehicles, which define various electric vehicle tests for hybrid, plug-in hybrid and fuel cell vehicles. Chroma has integrated these regulatory requirements aiming to provide users with specialized and convenient test programs making Chroma a productive partner for testing new energy vehicles.

The test requirements of LV123 are defined by major European carmakers to test the electrical characteristics and safety of high-voltage components in road vehicles, such as HV battery system, inverter, electrical air conditioning compressor, electrical transmission oil pump, DC/DC converter HV/LV and On-board charger, etc. This standard defines the state and operating capability of each voltage range.

The LV123 standard regulates different states for voltage range from 0V to 800V, as shown in the table below, and demands rapid voltage slew rate change. Chroma’s 62150H-1000 DC power supply supports 0-1000V voltage output with up to 40V/ms slew rate control and can meet the LV123 basic electrical characteristics requirements through the test items listed below providing the best solution for testing new energy vehicles.

HV voltage ranges Unit HV_1 HV_2a HV_2b HV_3
Overvoltage at load dump V pk 220 410 500 800
Upper HV circuit limit voltage V pk 220 410 500 800
Maximum operating voltage V d.c. 200 360 470 770
Upper limited operating capability >V d.c. > 190 – 220 > 340 – 460 > 450 – 470 > 750 – 770
Unlimited operating capability V d.c. 90 – 190 170 – 340 250 – 450 520 – 750
Lower limited operating capability V d.c. 80 -< 90 160 -< 170 200 -< 250 450 -< 520
Highly limited operating capability V d.c. 60 -< 80 120 -< 160 200 -< 250
Undervoltage V d.c. 0 -< 60 0 -< 120 0 -< 150 0 -< 450

The following test items are provided according to the LV123 standard.

  1. Range of unlimited operating capability
  2. Range of upper limited operating capability
  3. Range of lower limited operating capability
  4. Range of highly limited operating capability

Chroma integrated the voltage range operating capability of LV123 into the 62000H Series DC power supplies and developed graphical test software based on the regulatory criteria so that the user can perform tests on the UUT with only one key. This not only saves time in the development schedule but also facilitates testing automotive electronics for their long-term performance and stability.

Range of unlimited operating capability
Range of unlimited operating capability

Range of upper limited operating capability
Range of upper limited operating capability

Range of lower limited operating capability
Range of lower limited operating capability

Range of highly limited operating capability
Range of highly limited operating capability

To learn more about the computer graphical user interface:

<Introduction to Softpanel for Model 62000P&H Series>
<Programmable DC Power Supply Model 62000H Series>


ITC – The world’s Most Influential Professional Testing Technology Conference Held in Asia for the First Time

Chroma ATE Inc. was invited as one of the opening keynote speakers to address the convergence of electronic and semiconductor systems, and its impact on testing technology

The ITC-Asia (International Test Conference) successfully held on September 13-15 in Taipei, was a flagship conference in test technology. It gathered the IC test and design professionals around the world to confront the challenges the industry faces, and learn how these challenges are being addressed. The conference was dedicated to the process and design improvement of software and hardware – covering design verification, test, diagnosis, failure analysis, components, systems and application software.

To cope with the needs of complex process and system integration derived from IoT, cloud computing, automotive electronics and other emerging applications, the ITC moved to Asia for the first time and co-located with SEMICON Taiwan in 2017. The conference linked the supply chains from semiconductor design in the beginning to IC packaging and testing at the end to boost collaborations in creating more potential business opportunities. Three days of consecutive keynote speeches, industry topics, call for papers and technical courses, explored and analyzed the latest test technology trends with focuses on popular topics including the newest IoT, automotive electronic testing methods and safety standards, as well as the advanced multi chip packaging test and repair technologies.

I-Shih Tseng, the ISS BU general manager of Chroma ATE Inc. was invited as one of the keynote speakers in the opening to discuss the semiconductor testing technology from the perspective of a testing equipment supplier. While we enjoy the convenience and brand new experience brought by high-tech, it is a huge challenge for semiconductor chip producers and test equipment providers as the test is no longer just electronic and circuit testing, but different applications associated with many aspects such as mechanical, optical components, temperature, and even chemical composition.

I-Shih Tseng, the ISS BU general manager of Chroma ATE Inc.
▲I-Shih Tseng, the ISS BU general manager of Chroma ATE Inc.

Semiconductor test has evolved to a level of safety, responsibility and reliability. The IC quality is absolutely important for self-driving cars because it concerns personal safety. When the car is driving in different environments, the temperature can change from high heat to freezing as well as high winds and rain all make the IC chip’s reliability a necessity. Moreover, for new applications, such as in VCSEL 3D image sensing, it has to be sure that it is no harm to people. All of these new applications provide a challenge to chip manufacturers and test equipment manufacturers for their ability to keep the car safe for drivers.

This means that semiconductor test equipment manufacturers need to work with customers earlier in the design process. Chroma ATE has been a Turnkey Solution provider with core technology in measurement since 2011, and is the only manufacturer equipped with testing and automation capability. Chroma’s products are mainly used in communication (FPD, color and video, optical components, power electronics, passive components, electrical safety, thermoelectric temperature control and automatic optics), semiconductor/IC, and clean technology (EV, green battery, LED lighting and solar energy) industries to effectively improve the quality of customer products and production efficiency in helping customers enhance their competitiveness.

Chroma has many product lines to fulfill the needs of semiconductor testing by supplying various kinds of equipment from R&D to mass production such as large ATE test systems, sorting machines and compact PXI test platforms, all of them have complete corresponding products to give customers the most appropriate selection. The complete semiconductor solution of Chroma covers different wafer test applications including consumer chips (microprocessors, audio chips, computers/mobile peripherals, etc.), power chips (linear regulators, DC converters, AC converters, LED drivers, etc.), radio frequency chips (wireless network, blue, blue, etc.), power chips (such as microprocessors, audio chips, computers / mobile peripherals, etc.), RF chips (wireless network, Bluetooth, mobile communication, etc.), and chips for specific testing areas (image sensors, radio frequency identification, etc.)

New IoT applications Initiate comprehensive semiconductor testing needs

Internet of Things (IoT) digitizes the real world by narrowing the scattered information and consolidating the digital information of things. It has a broad market and application prospects that is structured in three layers; sensing, network and application. Ranging from logistics and transportation, health care, smart environment (home, office and factory) along with personal and social areas, almost anything can be closely related to IoT. The IoT chip has been widely used in network and various types of sensors. For different applications in a test environment, the way to ensure that each IC’s function, performance and quality meet the standard is specifically important. Chroma’s Semiconductor BU general manager, George Chang, indicated that to cope with diversified applications, semiconductor wafer testing must incorporate a variety of test items including temperature, radio frequency (RF), precision and speed, to meet all types of IoT applications and customer needs.

Chroma provides complete semiconductor test solutions including SoC / VLSI/ Analog test solutions, IC test handlers, PXI IC test platforms and equipment corresponding to various types of IoT applications in testing embedded processor, MCU, RF MUC, Light Sensor, Magnetic Sensor, G-Sensor/Gyro, CMOS Image Sensor, Finger Print Sensor, Laser Diode, PMIC), and diversified wireless network implementation.

The widespread use of IoT creates a huge demand for micro control units and sensors, which lead to fierce competition in cost and production. As electronic products are always aiming for high cost-performance ratio with better functionality, Chroma is capable of providing competitive test instruments that are flexible to integrate with other equipment and automated systems to meet the demands for increased testing requirements and cost savings.

AI, smart driving, system level and burn-in test ensure final quality of IC

In light of the evolution of semiconductor process and packaging technology, the capabilities of ICs used in consumer electronics, automobiles, internet of things and artificial intelligence are getting more powerful with increased packaging density. Herbert Tsai, the ISS BU deputy general manager of Chroma ATE Inc. pointed out that for the complex packaging products such as SoC/SIP/3D ICs, besides inspecting the power and signal through traditional automated test equipment (mixed single ATE), the System Level Test (SLT) and Burn-in (BI) inspection process are also applied to do a comprehensive testing on IC to ensure its final quality.

As the IoV (internet of vehicle) and smart driving are growing trends, many car manufacturers have implemented ESC (electronic stability control) systems to receive and send signals through the sensor, camera, lidar and RF equipped on the car. When the system has collected the information from each component, it will quickly analyze and evaluate the vehicle status, and give commands to correct the steering wheel, slow down, brake or alarm. This means the system must have powerful semiconductor components to support the overall operation. These automotive systems have to remain in normal operation even under extreme conditions as they are related to driving safety. For varied driving environments, the demand for tri-temperature system level testing (Tri temperature SLT) on car chips is rapidly emerging. The product quality of car chips can be assured after rigorous and long-hour high/low temperature testing.

In recent years, the development of AI chips has been the frontline of first-tier manufacturers. The development of artificial intelligence at this stage is based on parallel computing technology and the depth of deep learning. Through the robust capabilities of self-learning and computing inside the chip, the equipment or systems are able to react properly in time. However, these types of high level chips (GPU/FPGA) are very expensive with strict quality demands, and passing through long hours of SLT/Burn-in test is the way to guarantee that every chip can operate normally under high temperature and high voltage environments.

Chroma has been dedicated to FT / SLT Handler technology research and development for a long time. In addition to the desktop equipment for the design house, Chroma also provides multi-functional and efficient test equipment for designers to use. Moreover, Chroma has introduced multi-probe tri-temperature test equipment to satisfy customer’s demand for mass production. The test technologies proprietary to Chroma can also be customized to meet customer needs providing the best test solutions.


Fast Transients, Low Noise in Chroma’s New Benchtop DC Power Supplies

Chroma’s newly launched 62000L Series programmable DC power supplies provide low ripple, low noise linear performance and a fast transient response in a lightweight, compact, and cost effective package.

As Chroma’s next generation of power supplies, the 62000L Series delivers pure and stable DC power as well as built-in features designed to meet the stringent requirements of next generation power electronics including automotive power electronics MCU/ECU, communication electronic parts, and semiconductor IC drivers.

Comparison of traditional models

Auto-ranging allows for freely adjusting the voltage and current. This feature eliminates the need to manually select the optimum range allowing all of the power to be available across all of the voltage and current settings.

Fast transient response makes the output voltage that changed due to load characteristics return to a stable supply of power in microsecond response speed. Take the 62010L-36-7 model for example, when the output current changes from half load to full load at the speed of 1A/μs, the voltage change of the actual output can return to 15mV within 30μs.

Low noise input power with pure quality protects the precision load or UUT from the interference of heavy noise. For example, the 62010L-36-7 output voltage noise is lower than 2mVp-p (20~20MHz) under the maximum rated current and maximum output power.

The auto sequencing programming function built into the 62000L Series allows the user to define and edit the output waveforms with 8 steps per cycle.

Conventional linear power supplies are cumbersome due to the frequency design and require more space for ventilation. Chroma simplified the design of the hardware architecture resulting in a better handling compact, lightweight design which is safer to stack.

The brand new 62000L Series programmable DC power supplies features an affordable price, high quality output specifications, practical functions, and standard USB and GPIB communication interfaces making this an excellent choice for testing small power and precision products.


Chroma ATE Inc.

Chroma’s Battery Production Line Automated Test Solution Adopted by Famous Automotive Manufacturers in China

Chroma ATE Inc. is a world leading supplier of precision Test and Measurement Instrumentation, Automated Test Systems, Intelligent Manufacturing Systems, and Turnkey Test and Automation Solutions. In recent years, Chroma has been actively cultivating the electric vehicle (EV) testing market, and its newly launched lithium battery pack end-of-line (EOL) automated test solution has been successfully adopted by several of China’s well-known automotive manufacturers. Our solution provides safe, real-time monitoring of the test process and saves up to 6 times the inspection time, significantly reducing the production cost.

Once an automotive manufacturer completes the selection of battery cells and battery pack design, as well as development, it then faces bottlenecks in cost and speed during the process of mass production. The safety of EV battery pack production must be taken seriously as the process encompasses potential danger of high voltage and high energy density. Using an automatic battery inspection system can reduce production costs and improve the throughput effectively, and also ensures the safety of the entire fabrication process. Moreover, manual tests can cause inconsistent results, handwritten data errors, long testing hours, product traceability problems and more. At present, automotive manufacturers request that the EOL test for the finished battery packs before shipment takers 10 ~ 20 min/pcs with real-time monitoring, automatic reporting of traceability, and security protection mechanisms. Hence, the modular and automated test solution has been gradually adopted by many automotive manufacturers for battery production.

 Model 8700ATS Battery Pack Automatic Test System▲  Model 8700ATS Battery Pack Automatic Test System

The testing functions applied by the lithium battery pack EOL automated test system encompasses mechanical assembly, high voltage insulation, battery management system (BMS) communication, internal on/off switches, battery unbalance, and temperature distribution, etc. The comprehensive PASS/FAIL tests can be used not only for production line but also for R&D near completion phase or battery pack feeding inspection. Automated testing avoids personal misuse and ensures the safety of operators, which is applicable for the battery modules of electric cars, electric motorcycles and energy storage systems. The main features and specifications of Chroma’s battery pack automated test system are listed below:

  • For battery module production or R & D unit test verification use.
  • Improve product inspection efficiency.
  • Test the battery module for BMS function / connector withstand voltage / consistency / performance.
  • Charge and discharge power range: 5kW ~ 500kW.
  • Charge and discharge power/current range:0V~1200V/0A~2600A.
  • Standard test items include: Insulation test, electrical test, software/communication test and battery performance test.
  • Capable of providing customized fixtures to connect the battery modules with automatic control switching function.

The lithium battery pack EOL automated test system can integrate with Chroma’s electrical safety analyzers, switching fixtures, digital meters, and regenerative charge/discharge test systems through an open software platform for diversified testing applications. With the support of Shop-Floor programs and MES handshakes, it is easy to integrate data incorporation and tracking. The test system can also handle different automated production line requirements for PLC, MES, and security mechanisms to provide a more complete customized automated test station.

With 30 years of experience in test and measurement instrumentation, Chroma is able to provide a wide variety of test solutions for power and storage batteries. These include: regenerative battery pack test systems for battery cells, battery modules, and battery packs; BMS test systems; battery pack EOL auto test systems; battery simulators; and super capacitors. These solutions are in use worldwide by manufacturers and third party laboratories.

For any questions regarding these battery test solutions, please provide your contact information. We will reach out to you for further service.

Battery Test Solutions