Chroma Offers Semiconductor Test Solutions beyond Your Expectation

From nanoparticle monitoring for processing liquids to semiconductor testing complying with AIoT applications

To be in the tech trend of IoT, Chroma ATE provides a wide portfolio of semiconductor IC test solutions ranging from ATE, PXI systems, IC handlers, and system level test solutions. Innovative Nanotech, a member of Chroma Group, has introduced nanoparticles monitoring systems for semiconductor front-end processes. In SEMICON Taiwan 2018, Chroma will exhibit the SuperSizer in-line nanoparticle monitoring system for you to experience it on site.

SuperSizer Nanoparticle Monitoring System
The technology nodes of semiconductor have advanced to 10 nm and 7 nm at an extremely fast speed, and will be 5 nm or even 3 nm in the near future. However, the capabilities of the current particle monitoring technologies can barely monitor particles larger than 20 nm, which lag far behind the industry need. Innovative Nanotech launched an in-line nanoparticle monitoring system, SuperSizer, to detect accurately and efficiently the size and distribution of nanoparticles less than 20 nm. SuperSizer is designed to work 24/7 to improve the purity of the wet chemicals and fabrication yield of semiconductor production.

SoC Test System for Smart Network
AI data analysis, big data statistics, voice identification, and network security are the keys to make home smarter and more convenient. In recent year, Chroma has been aggressively developing the equipment to test SoC chips used in the smart home ecosystems by providing highly integrated measurement solution to satisfy the low cost and complex SoC test requirements.

The HDAVO (High Density Audio Video Option) is an optional mixed-signal module that can provide source and capture test capabilities with Arbitrary Waveform Generator (AWG) and Digitizer (DGT) functions when integrated into an audio recognition SoC test system. The module has 8 AWG and 8 digitizers on an instrument board with sampling rate up to 400Msps for each AWG and 250Msps for each DGT. The advantages of high specification, low cost and multi-functional make it suitable for a wide range of mixed signals tests and even applicable for I/Q signals development for the future 5G baseband chips. The CRISPro software environment provides a powerful tool for the users to edit or debug the test programs quickly and easily via a Graphic User Interface (GUI). The supported concurrent testing function not only reduces the programming time but also accelerates the production speed.

IoT Connectivity Test Solution
With its versatile wireless measurement technologies, the MP5806 RF tester is readily integrated into the classical portfolio of Chroma semiconductor test equipment, offering an upgrade option of RFIC testing for the pre-existing Chroma VLSI / SoC test systems in addition to their essential capabilities in testing digital, analog, or mixed-signal IC. Developed by Adivic Technology in Chroma Group, the MP5806 RF tester supports major Internet of Things (IoT) wireless standards such as NB-IoT, GPS/BeiDou, Wi-Fi, Bluetooth, tuner, and others. Its broadband VSG/VSA module with 10MHz~6GHz full-frequency coverage can comprehensively cover future wireless standards.

PXIe Digital I/O Card with ATE Function
The Chroma 33010 PXIe Digital I/O Card provides automatic test functions based on PXIe architecture to meet the coming demand of PXI testing. To satisfy smaller IC channels and increasingly complex test functions, especially on IoT and automotive electronics IC, the PXI/PXIe architecture in semiconductor tests offers advantages of diversity and flexibility in MCU, MEMS, RF IC and PMIC testing. It is also feasible for porting to Chroma 3380D (256 channels), Chroma 3380P (512 channels) and Chroma 3380 (1024 channels) for mass-production as they have high similarity in both software and hardware.

SEMICON Taiwan 2018 will be held from September 5~7, and Chroma will show the newest semiconductor/IC test solutions at the Taipei Nangang Exhibition Hall 1 (Booth No. K2785) with many more customized solutions to fulfill your requirements. We welcome you to experience new trends in test and measurement, and look forward to meeting you at this annual event.

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SuperSizer Nanoparticle Monitoring System

For more information please check at SEMICON TAIWAN 2018

Chroma Facilitates Smart Factory Build-up with Integrated Solutions

Chroma ATE Inc. is a world-leading supplier of precision Test and Measurement Instrumentation, Automated Test Systems, Smart Manufacturing System, and Smart-automation Total Turnkey Solutions. With more than 30 years of practical experience in the field, Chroma is delighted to present its hardware, software, and AI integration capabilities. Visit us at booth J1112 at the Taipei International Industrial Automation Exhibition.

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Multi-Functional Optical Measuring System

As the optical inspection technology advances its application in various markets, innovative manufacturing process and automated optical testing has become vital when performing dimensional measurements. The Chroma 7505-05 Multi-Functional Optical Measuring System is specially designed for quality inspection on mobile phone metal casings, batteries, cover glass, automotive components, etc. Combining 2D and 3D fast online measurement functions, the system can assist in real-time process monitoring for data collection, process control, and early problem detection. The system helps customers improve their efficiency and competitiveness in dimensional measurement.

Manufacturing Execution Systems (MES)

An intelligent factory means having computerized production history, visualized inspection, and workstation monitoring and management with AI implementation to aid enterprise in manufacturing process analysis, improvement and forecasting so that to build a smart factory of Industry 4.0. The Sajet modular designed MES products provide MES, EAP connection, WMS, FEP (fast easy player) visualized kanban, and AI big data analysis functions.

Touch Cloud AI Surveillance

Touch Cloud creates AI software for industry 4.0 and surveillance using deep learning, providing massive and high-dimensional numerical data analysis for automated plants. The company’s AI processes leverage continual streaming data at the time and place acquired. Edge capabilities eliminate the roundtrip to the back-end server, reducing latency and accelerating response. The AI solution provides near-real-time insights, so that operators can make decisions faster, more efficiently, and more accurately. In addition, the solution enhances security while optimizing costs because the data is neither transported across the network nor stored in data centers.

The Touch Cloud solution supports modern industrial scenarios requiring real-time observation and response times in milliseconds (such as defect detection) which normally cannot be achieved with a traditional server-based AI setup. Furthermore, Touch Cloud runs AI on edge devices with high levels of performance and accuracy. This allows industry 4.0 to facilitate abnormality prediction and root cause analytics in manufacturing plants.

Chroma offers many more Smart Factory Solutions to fulfill your custom requirements. With great enthusiasm, we welcome you to attend the Taipei International Industrial Automation Exhibition and visit our booth. Let’s connect!

Taipei International Industrial Automation Exhibition (Aug. 1 ~4)

1F, Taipei Nangang Exhibition Hall 1 (Booth No.: J1112)

Check out here to find out more information!